Early and accurate fault detection and diagnosis for modern chemical plants can minimize downtime, increase the safety of plant operations, and reduce manufacturing costs. This book presents the theoretical background and practical techniques for data-driven process monitoring. It demonstrates the application of all the data-driven process monitoring techniques to the Tennessee Eastman plant simulator, and looks at the strengths and weaknesses of each approach in detail. A plant simulator and problems allow readers to apply process monitoring techniques.
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Titolo: Fault Detection and Diagnosis in Industrial Systems
Autore:
Chiang Leo H.,
L. H. Chiang,
Russell Evan
Editore: Springer
Data di Pubblicazione: 2000
Pagine: 00279
Formato: 2
ISBN: 9781852333270